Packages

•  package root

  Definition Classes

  root

•  package chisel3

  Definition Classes

  root

•  package iotesters

  Definition Classes

  chisel3

•  abstract class OrderedDecoupledHWIOTester extends HWIOTester

  Base class supports implementation of test circuits of modules that use Decoupled inputs and either Decoupled or Valid outputs Multiple decoupled inputs are supported.

  Base class supports implementation of test circuits of modules that use Decoupled inputs and either Decoupled or Valid outputs Multiple decoupled inputs are supported. Testers that subclass this will be strictly ordered. Input will flow into their devices asynchronously but in order they were generated be compared in the order they are generated

  Definition Classes

  iotesters

  Annotations

  @deprecated

  Deprecated

  (Since version chisel-iotesters 2.5.0) chisel-iotesters is end-of-life. Use chiseltest instead, see https://www.chisel-lang.org/chiseltest/migrating-from-iotesters.

  Example:

  1. class XTimesXTester extends [[OrderedDecoupledHWIOTester]] {
       val device_under_test = new XTimesY
       test_block {
         for {
           i <- 0 to 10
           j <- 0 to 10
         } {
           input_event(device_under_test.io.in.x -> i, device_under_test.in.y -> j)
           output_event(device_under_test.io.out.z -> i*j)
         }
       }
     }

     an input event is a series of values that will be gated into the decoupled input interface at the same time an output event is a series of values that will be tested at the same time independent small state machines are set up for input and output interface all inputs regardless of interfaces are submitted to the device under test in the order in which they were created likewise, all outputs regardless of which interface are tested in the same order that they were created

• GlobalEventCounter
• TestingEvent

chisel3.iotesters.OrderedDecoupledHWIOTester

TestingEvent